SISSCA Wafer AVI
2D/3D measuring, circuit inspection and visual inspection
Best AOI for mass Production: Higher throughput, high resolution!
Excellent Engineering Capability:
- High Line Rate Line-Scan Camera
- High Performance Lighting
- Optimized Algorithm
- Special Lighting Technique
- Multi-Inspection
- Auto Training
- Dynamic Tolerance
- Customized Lighting
- Auto Switch for different size of Wafer
- Customized Alignment Method
- Customized Recipe Setup Flow for Multi Pattern Wafer
