Corning Tropel manufactures a complete line of non-contact metrology instruments for the semiconductor, Precision Engineering & Post Lapping/Polishing Industry. Each system measures surface form with sub-micron accuracy in seconds. The data acquisition and analysis provides complete surface characterization in easy to read graphical output.

Designed to operate in a wide range of environment; from R&D lab to high volume production. Whatever your application, you will find a system that is right for you.

Rapid flatness measurements of high precision components with high resolution and accuracy.


High resolution and accuracy (up to 230,000 data points)
Large measurement surface (up to 200 mm).


Typical measurement time is < 10 seconds.


Measures various material types and surface finishes
Reports a wide variety of parameters, including easy-to-read graphs & charts for presentations & reports, as well as exports to databases and Excel

Easy to Use

Place parts and measure – little or no fixturing required
Intuitive recipe-driven operation.

Download our brochures for
various tool capabilities here:

FlatMaster Industrial Surface Form Analysis System

FlatMaster Wafer Form Analysis System

UltraFlat Photomask Form Analysis System

UltraSort Automatic Wafer Form Analysis System

Multi Surface Profiler Surface Metrology System